Carl Zeiss SMT Exhibits at 2005 Semicon EuropaNovember 17th, 2007 - 1:04 pm ICT by admin
Carl Zeiss SMT will be exhibiting at the major European semiconductor trade show Semicon Europa, 12 to 14 April 2005 in Munich, Germany.
The Semiconductor Metrology Systems Division will present two product lines: AIMS mask qualification tools and MeRiT advanced mask repair tools.
The unique AIMS
Tags: aims, carl zeiss, e beam, european semiconductor, high resolution imaging, mask repair, mask shops, merit, metrology systems, munich germany, nano imprint, nano technology, printing features, production tool, quartz substrate, repair tools, semicon europa, semiconductor metrology, smt, systems division